Process capability tool

v2.2|Updated May 2, 2026
Latest improvements
Mobile-friendly guide
Pp/Ppk option
Improved histogram controls

Cp, Cpk, Pp and Ppk Calculator

Calculate capability and performance indices from pasted measurements or summary statistics. Use the planner to estimate centered specification limits for a target index.

Cp/Cpk usually use within-process variation. Pp/Ppk use overall variation. With one pasted dataset, results may match unless different standard deviation estimates are entered.

Step 1

Paste measurement data

Separate values with commas, spaces, tabs, or new lines.

Step 2

Specification limits

Enter the engineering limits used to judge the process.

Formulas
Cp=USL - LSL6 x SD
CPU=USL - Mean3 x SD
CPL=Mean - LSL3 x SD
Cpk = min(CPU, CPL)

Statistics

Basic study results

Use within-process or short-term standard deviation.

Enter data to see the basic statistics.

Capability

Cp / Cpk results

Cpk is controlled by the weaker side of the process.

Enter data first.

Plot

Data sequence and distribution

First review the measurements in order, then compare the overall distribution shape.

Paste raw data to see the chart.

Learning center

Process capability guides

Use the calculator, then read the guide that matches the question you are trying to answer.

What is Cpk?

Understand Cpk, CPU, CPL, and capability risk.

Cp vs Cpk

Learn potential capability versus actual capability.

Pp vs Ppk

Compare performance indices with capability indices.

Histogram bins

See how bin rules affect distribution charts.

Sample size

Why small samples can make Cpk unstable.

Methodology

Review formulas, assumptions, and limitations.

Interactive guide

Learn the terms visually

Click a term to see what changes in the process picture.

LSLUSLMean
What to notice

If the mean moves left or right, the process center moves with it.

Mean

Mean is the process center

Mean is the average of all measurements. It tells you where the process is centered and whether the process is drifting toward the upper or lower specification limit.

Mean=Sum of all measurementsNumber of measurements
Try meanMean: 10.0060

Cp vs Cpk: potential vs actual

Cp asks whether the process spread can fit inside the specification limits if it is centered. Cpk asks where that same spread actually sits. When the mean shifts toward USL or LSL, part of the curve can move beyond the limit, so Cpk drops even when Cp still looks good.

Cp vs Cpk visual example

Same spread, different centering.

Cp view: centered process

Cp = 2.00Cpk = 2.00
LSLUSLMeanDistance to USL

Cp describes potential capability by comparing spread with the tolerance band. When the curve is centered, Cpk can match Cp.

Cpk view: same spread, shifted mean

Cp = 2.00Cpk = 0.70
LSLUSLMeanDistance to USLOut of spec

The spread is unchanged, so Cp stays high. Cpk falls because the shifted curve now extends beyond the upper specification limit.